Principal Optical Wafer-Scale Test Lead
Marvell Technology
- Location
- Santa Clara, CA
- Work model
- On-Site
- Level
- Principal
- Posted
- 1d ago
Skills
About this role
About Marvell Marvell’s semiconductor solutions are the essential building blocks of the data infrastructure that connects our world. Across enterprise, cloud and AI, and carrier architectures, our innovative technology is enabling new possibilities. At Marvell, you can affect the arc of individual lives, lift the trajectory of entire industries, and fuel the transformative potential of tomorrow. For those looking to make their mark on purposeful and enduring innovation, above and beyond fleeting trends, Marvell is a place to thrive, learn, and lead. Your Team, Your Impact Your Team, Your Impact Marvell's Photonic Fabric Engineering team is at the forefront of one of the most exciting technology transitions in the semiconductor industry — bringing Silicon Photonics (SiPh) from cutting-edge research into high-volume production for next-generation AI and data center interconnects. Our team develops and characterizes Marvell's Photonic Fabric™ technology, the most advanced photonic integrated circuits (PICs) in the industry, enabling breakthrough XPU connectivity for hyperscale AI infrastructure. As a Principal Test Engineering Lead focused on Wafer Level Prober test, you will be a core technical expert responsible for the hands-on development, execution, and continuous improvement of wafer-scale probe characterization. The work you do every day directly determines whether Marvell's next-generation photonic products meet the performance, yield, and reliability that the market demands. What You Can Expect This is a deeply hands-on individual contributor role. The ideal candidate leads from the bench — driving test recipe development, prober automation, data infrastructure, and continuous improvement of wafer-level probe capabilities for Silicon Photonics production and NPI. Wafer-Level Probe Operations Own the end-to-end operation, maintenance, and continuous improvement roadmap of wafer-scale probe stations for Silicon Photonics characterization. Develop, qualify, and execute test recipes for passive and active optical/opto-electronic components, supporting both library development and production sort. Coordinate with prober vendors to implement new test functionality, integrate new test equipment, and resolve hardware and software issues. Establish and maintain calibration protocols, preventive maintenance schedules, and gauge R&R programs to ensure measurement integrity. Test and Data Infrastructure & Analysis Develop and maintain automation scripts for instrument control, prober sequencing, and data processing. Lead setup and maintenance of data infrastructure to handle, archive, and analyze large-volume wafer prober outputs. Apply statistical analysis tools (JMP, DataConductor, or equivalent) to identify process excursions, equipment trends, and yield drivers. Generate clear engineering reports and communicate findings to cross-functional stakeholders including design, process, and product engineering teams. NPI & Continuous Improvement Support New Product Introduction (NPI) by driving correlation between wafer-level test results, sub-system characterization, and system-level validation. Define and execute test improvement plans to expand test coverage, reduce test time, and improve prober throughput and reliability.
What We're Looking For
Specialized Technical Skills Deep, hands-on experience with commercial wafer-scale probe stations (e.g., Cascade/FormFactor, MPI, or equivalent) — this is a core requirement. Candidates must have direct, personal experience operating, configuring, and maintaining SiPh wafer-level probe systems. Strong experience developing optical test setups and measurement methodologies for Silicon Photonics, including familiarity with tunable lasers, power meters (PWMs), OSAs, and fiber arrays. Proficiency with automated instrument and machine control using Python (preferred), MATLAB, LabVIEW, or C#. Ability to collect, manage, and analyze complex wafer-level datasets using JMP,